Surface Analysis of Paper

This book examines surface analysis techniques from a paper industry perspective and places heavy emphasis on applications. Modem techniques, including ion mass spectrometry, infrared spectroscopy, and optical profilometry are reviewed in a straightforward manner. Details on methods and instruments are provided, and discussions on how they can be used to attain analyses of the properties of paper are presented.

Surface Analysis of Paper examines surface analysis techniques from a paper industry perspective and places heavy emphasis on applications. Modern techniques, including ion mass spectrometry, infrared spectroscopy, and optical profilometry are reviewed in a straightforward manner. This new book provides details on widely used methods and instruments, and discusses how they can be used to attain, for example, contour maps of the microscopic constituents on paper surfaces and accurate analyses of the physical properties of paper.Organized into three sections, Surface Analysis of Paper provides thorough coverage of the physical characteristics of paper, and a clear picture of new and emerging analytical methods. Carefully chosen background material on fundamental concepts is included wherever such material assists in understanding the uses of analysis methods. Each chapter contains:An introductionA description of the techniqueA discussion of the type of information that can be obtained with the particular techniquePractical examples to demonstrate the advantages of the technique

Physical Characterization of SurfacesThree-Dimensional Evaluation of Paper Surfaces Using Confocal Microscopy, M.-C. Béland and P.J. ManginScanning Electron Microscopy: A Tool for the Analysis of Wood Pulp Fibers and Paper, G. de Silveira, P. Forsberg, and T.E. ConnersMechanical and Physical Properties of Paper Surfaces, J.F. WaterhouseThe Surface Chemistry of Paper: Its Relationship to Printability and Other Paper Properties, F.M. Etzler and J.J. ConnersBrightness Properties of Pulp and Paper, A.J. RagauskasSpectroscopic MethodsFT-IR Spectroscopy, M.A. Friese and S. BanerjeeNear-Infrared Spectroscopy of Wood Products, J.M. PopeRaman Spectroscopy, U.P. Agarwal and R. AtallaEnergy-Dispersive X-Ray Spectroscopic Analysis, G. de Silveira and T.E. ConnersSIMS: Secondary Ion Mass Spectrometry, L.D. Detter-Hoskin and K.L. BuschX-Ray Photoelectron Spectroscopy, W.K. IstoneEmerging TechnologiesPrinciples of Electron Energy Loss Spectroscopy and Its Application to the Analysis of Paper, G. BottonSurface Analysis Using Millimeter-Wave Resonant Instruments, J.S. MartensAtomic Force Microscopy, S.J. Hanley and D.G. GrayUsing the Photon Tunneling Microscope to View Paper Surfaces, T.B. Arnold, T.E. Conners, and G.L. DyerIndex

Conners\, Terrance E.; Banerjee\, Sujit