Surface Analysis of Polymers by XPS and Static SIMS

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and SSIMS. He also includes details of case studies, emphasizing the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.

This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.

1. Introduction; 2. X-ray photoelectron spectroscopy (XPS); 3. Information from polymer XPS; 4. Static secondary ion mass spectrometry (SSIMS); 5. Information from SSIMS; 6. Polymer surface analysis case studies; References.

The behaviour of polymer and plastic surfaces is critical to a variety of applications of these materials. This in turn is governed by the chemical structure and composition of the outermost molecular layers. This book describes the instrumentation, physical bases and application of XPS and SSIMS, two of the most powerful techniques for polymer surface chemical analysis to have emerged in the past 25 years.