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sun yongke; thompson scott e.; nishida toshikazu - strain effect in semiconductors
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Strain Effect in Semiconductors Theory and Device Applications

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Dettagli

Genere:Libro
Lingua: Inglese
Editore:

Springer

Pubblicazione: 11/2014
Edizione: 2010





Trama

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.




Sommario

Overview: The Age of Strained Devices.- Band Structures of Strained Semiconductors.- Stress, Strain, Piezoresistivity, and Piezoelectricity.- Strain and Semiconductor Crystal Symmetry.- Band Structures of Strained Semiconductors.- Low-Dimensional Semiconductor Structures.- Transport Theory of Strained Semiconductors.- Semiconductor Transport.- Strain in Semiconductor Devices.- Strain in Electron Devices.- Piezoresistive Strain Sensors.- Strain Effects on Optoelectronic Devices.










Altre Informazioni

ISBN:

9781489983152

Condizione: Nuovo
Dimensioni: 235 x 155 mm
Formato: Brossura
Illustration Notes:XII, 350 p.
Pagine Arabe: 350
Pagine Romane: xii


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