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liu johan; salmela olli; sarkka jussi; morris james e.; tegehall per-erik; andersson cristina - reliability of microtechnology
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Reliability of Microtechnology Interconnects, Devices and Systems

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Dettagli

Genere:Libro
Lingua: Inglese
Editore:

Springer

Pubblicazione: 02/2011
Edizione: 2011





Trama

Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail.

The book also includes exercises and detailed solutions at the end of each chapter.





Sommario

Introduction to Reliability and its Importance.- Reliability Metrology.- General Failure Mechanisms of Microsystems.- Solder and Conductive Adhesive Joint Reliability.- Accelerated Testing.- Reliability Design for Manufacturability.- Component Reliability.- System Level Reliability.- Reliability and Quality Management of Microsystem.- Experimental Tools for Reliability Analysis.











Altre Informazioni

ISBN:

9781441957597

Condizione: Nuovo
Dimensioni: 235 x 155 mm
Formato: Copertina rigida
Illustration Notes:XIII, 204 p.
Pagine Arabe: 204
Pagine Romane: xiii


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