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schattschneider peter (curatore) - linear and chiral dichroism in the electron microscope
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Linear and Chiral Dichroism in the Electron Microscope




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Dettagli

Genere:Libro
Lingua: Inglese
Pubblicazione: 06/2011
Edizione: 1° edizione





Note Editore

This book describes energy loss magnetic chiral dichroism (EMCD), a phenomenon in energy loss spectroscopy discovered in 2006. EMCD is the equivalent of XMCD but is based on fast probe electrons in the electron microscope. A spatial resolution of 2 nm has been demonstrated, and the lattice-resolved mapping of atomic spins appears feasible. EMCD is, thus, a promising technique for magnetic studies on the nanometer and sub-nanometer scale, providing the technical and logistic advantages of electron microscopy, such as in situ chemical and structural information, easy access, and low cost.




Sommario

Basic ConceptsMomentum Resolved ELNES, C. Hébert , J.-C. LeBosséRelativistic Effects and the Magic Angle, J.-C. LeBossé, C. HébertAn Introduction to XMCD, G.SchützChirality in EELS and the Role of the Angular Momentum, P. Schattschneider)Calculation Methods Multiplet Methods, L. Calmels, J. RuszDFT Methods, C. Ambrosch, L. Pardini, F. ManghiMultiple-Scattering Theory of Circular Dichroism, J. Rehr , H. WendeExperimental Chiral/Circular Dichroism EMCD Techniques and Geometries, S. Rubino et al.Data Treatment, Artefacts, Noise, K. Leifer, C. Gatel, B. Warot-Fonrose et al.The Role of the Crystal, J. Verbeeck, J. Rusz, S. RubinoSum Rules in EMCD and XMCD, J. Rusz, J. Rehr, L. CalmelsRelated Techniques and PerspectivesMagnetic Dichroism in X-Ray Holography, S. EisebittProspects for Spin Mapping with Atomic Resolution, M. Stöger-Pollach , J. Verbeeck, P. Schattschneider




Autore

Peter Schattschneider studied physics at the Vienna University of Technology, Austria, and finished in 1973 with a diploma thesis on diffusion profiles in thin films. In 1974, he enrolled in the study of college teacher for physics and mathematics at the University of Vienna and obtained a mag. rer. nat. degree in 1977. After his PhD thesis on X-ray diffraction of binary alloys, he left Vienna University of Technology in 1976 and came back in 1980 as assistant at the Institute for Applied and Technical Physics. In the meantime, he worked in an engineering enterprise, dealing with remote sensing (air- and spaceborne sensors). In 1981, he obtained the Theodor-Körner award for work on the EEL spectrometer installed at the old ELMISKOP IA. In 1988, he became assistant professor at the Institute for Applied and Technical Physics of the Vienna University of Technology, where his main research interests were electron microscopy, inelastic electron–matter interactions, and electron energy-loss spectrometry. In 1992 and 1993, he was employed by the CNRS (Centre Nationale de la Recherche Scientifique) in Paris. Since 1995, he has been professeur invité at the École Centrale Paris. From January 2000 to June 2006, he was head of the University Service Center for Transmission Electron Microscopy (USTEM).










Altre Informazioni

ISBN:

9789814267489

Condizione: Nuovo
Dimensioni: 9 x 6 in Ø 1.85 lb
Formato: Copertina rigida
Illustration Notes:126 b/w images
Pagine Arabe: 278


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