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kim choong-un (curatore) - electromigration in thin films and electronic devices

Electromigration in Thin Films and Electronic Devices Materials and Reliability




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Dettagli

Genere:Libro
Lingua: Inglese
Pubblicazione: 08/2016





Note Editore

Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. Electromigration in thin films and electronic devices provides an up-to-date review of key topics in this commercially important area.

Part one consists of three introductory chapters, covering modelling of electromigration phenomena, modelling electromigration using the peridynamics approach and simulation and x-ray microbeam studies of electromigration. Part two deals with electromigration issues in copper interconnects, including x-ray microbeam analysis, voiding, microstructural evolution and electromigration failure. Finally, part three covers electromigration in solder, with chapters discussing topics such as electromigration-induced microstructural evolution and electromigration in flip-chip solder joints.

With its distinguished editor and international team of contributors, Electromigration in thin films and electronic devices is an essential reference for materials scientists and engineers in the microelectronics, packaging and interconnects industries, as well as all those with an academic research interest in the field.

  • Provides up-to-date coverage of the continued development of advanced copper interconnects for integrated circuits
  • Comprehensively reviews modelling of electromigration phenomena, modelling electromigration using the peridynamics approach and simulation, and x-ray microbeam studies of electromigration
  • Deals with electromigration issues in copper interconnects, including x-ray microbeam analysis, voiding, microstructural evolution and electromigration failure




Autore

Choong-Un Kim is Professor of Materials Science and Engineering at the University of Texas at Arlington, USA.










Altre Informazioni

ISBN:

9780081016961

Condizione: Nuovo
Collana: Woodhead Publishing Series in Electronic and Optical Materials
Dimensioni: 234 x 19 x 156 mm
Formato: Brossura
Pagine Arabe: 352


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