libri scuola books Fumetti ebook dvd top ten sconti 0 Carrello


Torna Indietro

asundi a - digital holography for mems and microsystem metrology
Zoom

Digital Holography for MEMS and Microsystem Metrology




Disponibilità: Normalmente disponibile in 20 giorni
A causa di problematiche nell'approvvigionamento legate alla Brexit sono possibili ritardi nelle consegne.


PREZZO
118,95 €
NICEPRICE
113,00 €
SCONTO
5%



Questo prodotto usufruisce delle SPEDIZIONI GRATIS
selezionando l'opzione Corriere Veloce in fase di ordine.


Pagabile anche con Carta della cultura giovani e del merito, 18App Bonus Cultura e Carta del Docente


Facebook Twitter Aggiungi commento


Spese Gratis

Dettagli

Genere:Libro
Lingua: Inglese
Pubblicazione: 07/2011





Trama

Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes.
* Addresses particle characterization where digital holography has proven capability for dynamic measurement of particles in 3D for sizing and shape characterization, with applications in microfluidics as well as crystallization and aerosol detection studies.
* Discusses digital reflection holography, digital transmission holography, digital in-line holography, and digital holographic tomography and applications.
* Covers other applications including micro-optical and diffractive optical systems and the testing of these components, and bio-imaging.




Note Editore

Approaching the topic of digital holography from the practical point of view of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection. The author addresses the field of particle characterization where digital holography has proven its capability for dynamic measurement of particles in 3D for sizing and shape characterization which offers applications in microfluidics as well as crystallization and aerosol detection studies. Other applications covered include micro-optical and diffractive optical systems and the testing of these components, and bio-imaging. Digital Holography for MEMS and Microsystem Metrology takes a practical applications-based approach yet includesa thorough enough theoretical background to allow users a means of understanding basic concepts & thus identify areas where this technique can be adopted. This ensures its relevance and appeal not only to researchers but also companies who might want to see the potential of such systems for integration into their existing machines and processes.




Sommario

Approaching the topic of digital holography from the practical point of view of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection. The author addresses the field of particle characterization where digital holography has proven its capability for dynamic measurement of particles in 3D for sizing and shape characterization which offers applications in microfluidics as well as crystallization and aerosol detection studies. Other applications covered include micro-optical and diffractive optical systems and the testing of these components, and bio-imaging. Digital Holography for MEMS and Microsystem Metrology takes a practical applications-based approach yet includesa thorough enough theoretical background to allow users a means of understanding basic concepts & thus identify areas where this technique can be adopted. This ensures its relevance and appeal not only to researchers but also companies who might want to see the potential of such systems for integration into their existing machines and processes.










Altre Informazioni

ISBN:

9780470978696

Condizione: Nuovo
Dimensioni: 241 x 18.58 x 162 mm Ø 458 gr
Formato: Copertina rigida
Pagine Arabe: 232


Dicono di noi