Structural, Syntactic, and Statistical Pattern Recognition

TRAMA

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

SOMMARIO

Classification and data processing.- Deep learning.- Graph-theoretic methods.- Multimedia analysis and understanding.

ALTRE INFORMAZIONI

• Condizione: Nuovo
• ISBN: 9783030739720
• Collana: Lecture Notes in Computer Science
• Dimensioni: 235 x 155 mm
• Formato: Brossura
• Illustration Notes: XII, 378 p. 103 illus., 84 illus. in color.
• Pagine Arabe: 378
• Pagine Romane: xii