Reflection Electron Microscopy and Spectroscopy for Surface Analysis

TRAMA

This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy-loss spectra in different scattering geometries. This and many other features makes the book an important and timely addition to the materials science literature for researchers and graduate students in physics and materials science.

NOTE EDITORE

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

SOMMARIO

1. Kinematical electron diffraction; Part I. Diffraction of Reflected Electrons: 2. Reflection high-energy electron diffraction; 3. Dynamical theories of RHEED; 4. Resonance reflections in RHEED; Part II. Imaging of Reflected Electrons: 5. Imaging in TEM; 6. Contrast mechanisms of reflected electron imaging; 7. Applications of UHV REM; 8. Applications of non-UHV REM; Part III. Inelastic Scattering and Spectrometry of Reflected Electrons. 9. Phonon scattering in RHEED; 10. Valence excitation in RHEED; 11. Atomic inner-shell excitations in RHEED; 12. Novel techniques associated with reflection electron imaging; Appendix A. Physical constants, electron wavelengths and wave numbers; Appendix B. Crystal inner potential and atomic scattering factor; Appendix C.1. Crystallographic structure systems; Appendix C.2. FORTRAN program for calculating crystallographic data; Appendix D. Electron diffraction patterns of several types of crystals structures; Appendix E. FORTRAN programs; Appendix F. Bibliography of REM, SREM and REELS; References.

PREFAZIONE

Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.

ALTRE INFORMAZIONI

• Condizione: Nuovo
• ISBN: 9780521017954
• Dimensioni: 244 x 25 x 170 mm Ø 731 gr
• Formato: Brossura
• Illustration Notes: 224 b/w illus. 10 tables
• Pagine Arabe: 460