Efficient Test Methodologies for High-Speed Serial Links

TRAMA

Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

SOMMARIO

An Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.

ALTRE INFORMAZIONI

• Condizione: Nuovo
• ISBN: 9789400730946
• Collana: Lecture Notes in Electrical Engineering
• Dimensioni: 235 x 155 mm
• Formato: Brossura
• Illustration Notes: XII, 98 p.
• Pagine Arabe: 98
• Pagine Romane: xii