Applied Scanning Probe Methods XI

SOMMARIO

Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.

ALTRE INFORMAZIONI

• Condizione: Nuovo
• ISBN: 9783642098697
• Collana: NanoScience and Technology
• Dimensioni: 235 x 155 mm
• Formato: Brossura
• Illustration Notes: LVI, 236 p. 113 illus., 22 illus. in color.
• Pagine Arabe: 236
• Pagine Romane: lvi