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hawkes peter w. (curatore); hytch martin (curatore) - the beginnings of electron microscopy - part 2

The Beginnings of Electron Microscopy - Part 2

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Genere:Libro
Lingua: Inglese
Pubblicazione: 04/2022





Note Editore

The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917-1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.

  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in Advances in Imaging and Electron Physics series




Sommario

1. Recollections from the Early Years: Canada-USA
2. My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope
3. Walter Hoppe (1917-1986)
4. Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan
5. Early Electron Microscopy in The Netherlands
6. Hannes Lichte
7. L. L. Marton, 1901-1979
8. The Invention of the Electron Fresnel Interference Biprism
9. The Industrial Development of the Electron Microscope by the Metropolitan Vickers Electrical Company and AEI Limited
10. The Development of the Scanning Electron Microscope
11. Some Recollections of Electron Microscopy in Britain from 1943 to 1948
12. Otto Scherzer, 1909-1982
13. 1950-1960: A Decade from the Viewpoint of an Applications Laboratory
14. From the Cathode^Ray Oscillograph to the High-Resolution Electron Microscope
15. Reminiscences
16. Afterword




Autore

Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Dr Martin Hÿtch, serial editor for the book series "Advances in Imaging and Electron Physics (AIEP) , is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on "Quantitative high-resolution transmission electron microscopy (HRTEM) , joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.










Altre Informazioni

ISBN:

9780323989190

Condizione: Nuovo
Collana: Advances in Imaging and Electron Physics
Dimensioni: 229 x 152 mm
Formato: Copertina rigida
Pagine Arabe: 544


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