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o'connor d.j. (curatore); sexton brett a. (curatore); smart roger s.c. (curatore) - surface analysis methods in materials science

Surface Analysis Methods in Materials Science

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Dettagli

Genere:Libro
Lingua: Inglese
Pubblicazione: 04/2003
Edizione: 2nd ed. 2003





Trama

The success of the first edition of this broad appeal book prompted the prepa­ ration of an updated and expanded second edition. The field of surface anal­ ysis is constantly changing as it answers the need to provide more specific and more detailed information about surface composition and structure in advanced materials science applications. The content of the second edition meets that need by including new techniques and expanded applications. Newcastle John O'Connor Clayton Brett Sexton Adelaide Roger Smart January 2003 Preface to the First Edition The idea for this book stemmed from a remark by Philip Jennings of Mur­ doch University in a discussion session following a regular meeting of the Australian Surface Science group. He observed that a text on surface anal­ ysis and applications to materials suitable for final year undergraduate and postgraduate science students was not currently available. Furthermore, the members of the Australian Surface Science group had the research experi­ ence and range of coverage of surface analytical techniques and applications to provide a text for this purpose. A list of techniques and applications to be included was agreed at that meeting. The intended readership of the book has been broadened since the early discussions, particularly to encompass industrial users, but there has been no significant alteration in content.




Sommario

I Introduction.- 1 Solid Surfaces, Their Structure and Composition.- 2 UHV Basics.- II Techniques.- 3 Electron Microscope Techniques for Surface Characterization.- 4 Sputter Depth Profiling.- 5 SIMS — Secondary Ion Mass Spectrometry.- 6 Auger Electron Spectroscopy and Microscopy — Techniques and Applications.- 7 X-Ray Photoelectron Spectroscopy.- 8 Vibrational Spectroscopy of Surfaces.- 9 Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis.- 10 Materials Characterization by Scanned Probe Analysis.- 11 Low Energy Ion Scattering.- 12 Reflection High Energy Electron Diffraction.- 13 Low Energy Electron Diffraction.- 14 Ultraviolet Photoelectron Spectroscopy of Solids.- 15 EXAFS.- III Processes and Applications.- 16 Minerals, Ceramics and Glasses.- 17 Characterization of Catalysts by Surface Analysis.- 18 Application to Semiconductor Devices.- 19 Characterisation of Oxidised Surfaces.- 20 Coated Steel.- 21 Thin Film Analysis.- 22 Identification of Adsorbed Species.- 23 Surface Analysis of Polymers.- 24 Glow Discharge Optical Emission Spectrometry.- IV Appendix.- Acronyms Used in Surface and Thin Film Analysis.- Surface Science Bibliography.










Altre Informazioni

ISBN:

9783540413301

Condizione: Nuovo
Collana: Springer Series in Surface Sciences
Dimensioni: 235 x 155 mm Ø 1081 gr
Formato: Copertina rigida
Illustration Notes:XXVI, 585 p.
Pagine Arabe: 585
Pagine Romane: xxvi


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