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lowe b. g.; sareen r. a. - semiconductor x-ray detectors

Semiconductor X-Ray Detectors

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Dettagli

Genere:Libro
Lingua: Inglese
Editore:

CRC Press

Pubblicazione: 11/2017
Edizione: 1° edizione





Note Editore

Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SDDs), Charge Coupled Devices (CCDs), and Compound Semiconductor Detectors, including renewed interest in alternative materials such as CdZnTe and diamond, has made the Si(Li) X-Ray Detector nearly obsolete, the device serves as a useful benchmark and still is used in special instances where its large, sensitive depth is essential. Semiconductor X-Ray Detectors focuses on the history and development of Si(Li) X-Ray Detectors, an important supplement to the knowledge now required to achieve full understanding of the workings of SDDs, CCDs, and Compound Semiconductor Detectors. The book provides an up-to-date review of the principles, practical applications, and state of the art of semiconductor x-ray detectors. It describes many of the facets of x-ray detection and measurement using semiconductors, from manufacture to implementation. The initial chapters present a self-contained summary of relevant background physics, materials science, and engineering aspects. Later chapters compare and contrast the assembly and physical properties of systems and materials currently employed, enabling readers to fully understand the materials and scope for applications.




Sommario

IntroductionThe Detector and Charge Sensitive Preamplifier: A System OverviewThe TransducerWhy Semiconductors?Fermi-Dirac StatisticsDoping of SemiconductorsThe p-n Junction BarrierCharge Generation by RadiationPulse Height AnalysisX-Ray Spectroscopy NoiseLeakage Current Typical Noise ValuesThe FETDetector Response Function F(E)Categorization of Semiconductor DetectorsThe Lithium Drifted Silicon Detector (Si(Li))The Silicon Drift Detector (SDD) Detector Response FunctionThe Hypermet FunctionMonte-Carlo CalculationsPhysical Processes and the Analytical ApproachPeak Broadening - The Fano FactorCharge Collection Efficiency FunctionGeneration of Spectral Response FunctionCharge-Loss MechanismsCharge Gains Detector ArtifactsField DistortionThe SpurNon-LinearityGhost PeaksCompton ScatterSelf-CountingAbsorption EdgesSum PeaksElectron Contamination ContactsMetalParameters Influencing ICCReflectionDiffused Junction ContactsIon-Implanted ContactsSurface Barrier ContactsLow Injection ContactsEdge Termination of ContactsRadiation Damage Si(Li) X-Ray DetectorsManufacture of Si(Li) DetectorsThe Legacy of ContouringLosing the Process HPSi and HPGe X-Ray DetectorsHPSi X-Ray DetectorsHPGe X-Ray DetectorsPerformance X-Ray Detectors Based on Silicon Lithography and Planar TechnologySilicon p-i-n DiodesAvalanche Photo-diodes (APDs)Pixelated X-Ray Detectors (PXDs) CCD-Based X-Ray detectorsIntroductionTechniques of Scientific CCDsThe Performance of MOS-CCD X-Ray DetectorsThe pn-CCDCCDs Summary Silicon Drift DetectorsIntroductionConcentric Ring SDD X-Ray DetectorsDroplet SDD X-Ray DetectorsSDD PerformanceSDD ManufactureSDD Summary Wide Band-Gap SemiconductorsThe CandidatesGeneral Comments on WBGSThe Present Status of the WBGS X-Ray DetectorsSummary The History of Semiconductor X-Ray DetectorsIntroductionThe BeginningsThe Development of Materials during World War II1940-1960: Crystal Counters1940s: The Role of National Labs, Bell Telephone Labs, and other CorporationsThe Story of Silicon and GermaniumOther Materials1960-66: Progress in Detector Manufacture and SpectroscopySurface States and Nature’s Gift of SiO2Processing and Passivation1960s: The Evolution of Detector GeometriesContacts1960s: Lithium Compensation1960-1966: Amplifiers1966-71: Pulsed Optical RestoreApplications on the HorizonThe Companies1970s and 1980s: Evolution in the Commercial Environment1970s and 1980s: Low Energy EDXMA1987: The Kevex Quantum Window: Convenience verses PerformanceHigh Purity Germanium and Silicon1990s: HPGe X-Ray Detectors 1990s: Bespoke FETsConvenience verses Performance: A New ApproachSDD: The Influence of Nuclear Physics AgainSDDs as X-Ray DetectorsThe SDD EDXRS CompaniesThe Future




Autore

Author of over 20 publications and the "conditioner" patent for Si(Li) X-Ray Detectors, B. G. Lowe holds a Ph.D from Liverpool University, UK. He has served as commonwealth education officer for University of Columbo, Sri Lanka; lecturer for University of Science-Malaysia, Penang, and North East Wales Institute of Higher Education, UK; chief physicist for Link Systems Ltd, London, UK; physics director, head of development, and senior scientist for Oxford Instruments, London, UK; and senior scientist for e2V Scientific, High Wycombe, UK. He also worked on the UK government-sponsored IMPACT project and CdZnTe detectors at Leicester University, UK. Author of over 15 publications and two patents, R. A. Sareen holds a Ph.D from Manchester University, UK. He has served as research scientist for Ortec, Oak Ridge, Tennessee, USA; founder of Nuclan Ltd, London, UK; technical, managing, main board, and executive director for Link Systems Ltd, London, UK (now Oxford Instruments) and UEI London, UK; researcher at Manchester University; and shareholder in Link Systems Ltd, Gresham Power Electronics and Gresham Scientific Instruments Ltd, Salisbury, UK, and Camscan, Cambridge, UK. A Royal Microscopical Society and Institute of Physics fellow, he has liaised with several UK government departments, including security services, and participated in nuclear strategy and homeland security committees.










Altre Informazioni

ISBN:

9781138033856

Condizione: Nuovo
Collana: Series in Sensors
Dimensioni: 9.25 x 6.25 in Ø 1.00 lb
Formato: Brossura
Illustration Notes:343 b/w images, 16 color images and 14 tables
Pagine Arabe: 624


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