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yang fuqian (curatore); li james c.m. (curatore) - micro and nano mechanical testing of materials and devices

Micro and Nano Mechanical Testing of Materials and Devices

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Dettagli

Genere:Libro
Lingua: Inglese
Editore:

Springer

Pubblicazione: 11/2010
Edizione: Softcover reprint of hardcover 1st ed. 2008





Trama

Nanoscale and nanostructured materials have exhibited different physical properties from the corresponding macroscopic coarse-grained materials due to the size confinement. As a result, there is a need for new techniques to probe the mechanical behavior of advanced materials on the small scales. Micro and Nano Mechanical Testing of Materials and Devices presents the latest advances in the techniques of mechanical testing on the micro- and nanoscales, which are necessary for characterizing the mechanical properties of low-dimensional materials and structures.

Written by a group of internationally recognized authors, this book covers topics such as:

  • Techniques for micro- and nano- mechanical characterization;
  • Size effects in the indentation plasticity;
  • Characterization of low-dimensional structure including nanobelts and nanotubes;
  • Characterization of smart materials, including piezoelectric materials and shape memory alloys;
  • Analysis and modeling of the deformation of carbon-nanotubes.

Micro and Nano Mechanical Testing of Materials and Devices is a valuable resource for engineers and researchers working in the area of mechanical characterization of advanced materials.





Sommario

Principles and Applications of Indentation.- Size Effects in Nanoindentation.- Indentation in Shape Memory Alloys.- Adhesive Contact of Solid Surfaces.- Nanomechanical Characterization of One-Dimensional Nanostructures.- Deformation Behavior of Nanoporous Metals.- Residual Stress Determination Using Nanoindentation Technique.- Piezoelectric Response in the Contact Deformation of Piezoelectric Materials.- Mechanics of Carbon Nanotubes and Their Composites.- Microbridge Tests.- Nanoscale Testing of One-Dimensional Nanostructures.- Metrologies for Mechanical Response of Micro- and Nanoscale Systems.- Mechanical Characterization of Low-Dimensional Structures Through On-Chip Tests.










Altre Informazioni

ISBN:

9781441946201

Condizione: Nuovo
Dimensioni: 235 x 155 mm Ø 617 gr
Formato: Brossura
Illustration Notes:XIII, 387 p.
Pagine Arabe: 387
Pagine Romane: xiii


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