of Volume 2.- V. Lattice Location and Dechanneling in Disordered Crystals.- Analysis Problems in Lattice Location Studies.- Multi-String Statistical Equilibrium Calculation of Scattering Yield for Foreign Atom Location Using Channeling Effect.- Ion Channeling Studies of the Lattice Location of Interstitial Impurities: Hydrogen in Metals.- Depth Distribution of Damage Obtained by Rutherford Backscattering Combined with Channeling.- Helium Trapping in Aluminum and Sintered Aluminum Powders.- Helium Re-Emission and Surface Deformation in Niobium During Multiple Temperature Helium Implantation.- Studies on Compound Thin Film Semiconductors by Ion Beam and Electron Microscopy Techniques.- Energy Dependence of Channeling Analysis in Implantation Damaged Al.- Characterization of Reordered (001) Au Surfaces by the Combined Techniques of Positive Ion Channeling Spectroscopy (PICS), LEED-AES, and Computer Simulation.- Proton Channeling Applied to the Study of Thermal Disorder in AgBr.- Neon-Ion Implantation Damage Gettering of Heavy Metal Impurities in Silicon.- VI. Related Techniques.- A New Scanning Ion Microscope for Surface and In-Depth Analysis.- Sputtering of Thin Films in an Ion Microprobe.- Xe+ Ion Beam Induced Secondary Ion (Si+) Yield from Si-Metal Interfaces.- Surface Analysis of Ion Bombarded Metal Foils by XPS.- Chemical Reaction Enhancement and Damage Rate of Surface Layer Bombarded with Inert Ion Beams.- VII. Ion Induced X-Ray Spectroscopy.- Progress in the Description of Ion Induced X-Ray Production; Theory and Implication for Analysis.- K-Shell Ionization of Boron Induced by Light Ions Bombardment.- Effect of Channeling on Impurity Analysis by Charged Particle Induced X-Rays.- Depth Profiling with Ion Induced X-Rays.- Sensitivity in Trace Element Analysis of Thick Samples Using Proton Induced X-Rays.- Review of Trace Analysis by Ion Induced X-Rays.- The Use of Proton Induced X-Rays to Monitor the Near Surface Composition of Catalysts.- Application of Proton-Induced X-Ray Emission to Elemental Analysis of Oligo-Elements in Human Lymphocytes.- Elemental Analysis of Biological Samples Using Deuteron Induced X-Rays and Charged Particles.- Suppression of Radioactive Background in Ion Induced X-Ray Analysis.- VIII. Nuclear Reactions.- Depth Profiling of Hydrogen and Helium Isotopes in Solids by Nuclear Reaction Analysis.- Achievable Depth Resolution in Profiling Light Atoms by Nuclear Reactions.- Depth Profiling of Deuterons in Metals at Large Implantation Depths Using the Nuclear Reaction Technique.- Gas Reemission and Blister Formation on Nickel Surfaces During High Energy Deuteron Bombardment.- Unfolding Techiques for the Determination of Distribution Profiles from Resonance Reaction Gamma-Ray Yields.- Z2 Dependence of the Electronic Stopping Power of 800 keV 14N+ Ions in Targets from Carbon Through Molybdenum.- Sensitivity of Fluorine Detection in Different Matrices and at Different Depths Through the 19F(p,??)16O Reaction.- Ion Beam Analysis Techniques in Corrosion Science.- Quantitative Measurement of Light Element Profiles in Thick Corrosion Films on Steels, Using the Harwell Nuclear Microbeam.- Nuclear Microprobe Analysis of Reactor Materials.- Analysis or Microgram Quantities of Aluminum in Germanium.- Analysis of Fluorine by Nuclear Reactions and Application to Human Dental Enamel.- Determination of Nitrogen Depth Distributions in Cereals Using the 14N(d,p0)15N Reaction.- Experimental Measurements, Mathematical Analysis and Partial Deconvolution of the Asymmetrical Response of Surface Barrier Detectors to MeV 4He, 12C, 14N, 16O Ions.- Experimental Study of the Stopping Power and Energy Straggling of MeV 4He, 12C, 14N, 16O Ions in Amorphous Aluminium Oxide.- Author Index.