Preface Introduction to Materials Characterization; Baldev Raj, G. Amarendra and M. H. Manghnani Atomistic Characterization of Materials using Scanning Tunneling Microscopy (STM); Prof. S. Dharmadhikari, India Recent Advances in Characterization of Materials using Electron Microscopy; Dr. M. Vijayalakshmi, India X-ray Reflectance for Characterization of Multilayer Thin Films; Prof. Ajay Gupta, India in national and international journals. Latest Trends in Acoustic NDT Studies for Materials Characterization; Prof. C. H. Chen, USA, T. Jayakumar and Anish Kumar, India Characterization of Soft Condensed Matter using Confocal Microscopy; Dr. B.V. R. Tata and Dr. Baldev Raj, India Positron Annihilation Studies of Materials for Electronic Devices; Prof. R.. Suzuki, Japan and Dr.G . Amarendra, India Elasticity Characterization of Covalent (B-C-N) Hard Materials and Films by Brillouin Scattering; Prof. P.V. Zinn and Prof. M.H, Manghnani, USA
Materials characterization is an important area of fundamental and technological interest. Over the years, a variety of experimental techniques have been developed for characterizing the physical and chemical properties of materials. Advances in Materials Characterization offers an overview of this continually emerging discipline by providing an in-depth exploration of the latest techniques. It brings together a highly authoritative collection of articles written by experts from across the world who have been active in pioneering the techniques. Each chapter provides an introduction and an overview of the technique, and then proceeds to demonstrate its application to selected problems.
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