home libri books Fumetti ebook dvd top ten sconti 0 Carrello


Torna Indietro

hÿtch martin (curatore); hawkes peter w. (curatore) - advances in imaging and electron physics

Advances in Imaging and Electron Physics

;




Disponibilità: Normalmente disponibile in 20 giorni
A causa di problematiche nell'approvvigionamento legate alla Brexit sono possibili ritardi nelle consegne.


PREZZO
200,98 €
NICEPRICE
190,93 €
SCONTO
5%



Questo prodotto usufruisce delle SPEDIZIONI GRATIS
selezionando l'opzione Corriere Veloce in fase di ordine.


Pagabile anche con 18App Bonus Cultura e Carta del Docente


Facebook Twitter Aggiungi commento


Spese Gratis

Dettagli

Genere:Libro
Lingua: Inglese
Pubblicazione: 08/2022





Note Editore

Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.

  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics series
  • Updated release includes the latest information on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods




Sommario

Preface

Martin Hÿtch and Peter W. Hawkes

1. Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods

Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy

2. Development of a global homography-based approach for high-angular resolution in the SEM

Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy

3. Implementing the homography-based global approach

Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy

4. Numerical validation and influence of optical distorsions on accuracy

Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy

5. Applications of the method

Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger,Vincent Taupin and Emmanuel Bouzy

6. Spin wave physics: The nonlinear spin wave-electromagnetic interaction and implications for high frequency devices

Clifford M. Krowne





Autore

Dr Martin Hÿtch, serial editor for the book series "Advances in Imaging and Electron Physics (AIEP) , is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on "Quantitative high-resolution transmission electron microscopy (HRTEM) , joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.










Altre Informazioni

ISBN:

9780323988636

Condizione: Nuovo
Collana: Advances in Imaging and Electron Physics
Dimensioni: 229 x 152 mm
Formato: Copertina rigida
Pagine Arabe: 266


Dicono di noi