home libri books Fumetti ebook dvd top ten sconti 0 Carrello


Torna Indietro
ARGOMENTO:  BOOKS > INFORMATICA > TESTI GENERALI

hytch martin (curatore); hawkes peter w. (curatore) - advances in imaging and electron physics

Advances in Imaging and Electron Physics

;




Disponibilità: Normalmente disponibile in 20 giorni
A causa di problematiche nell'approvvigionamento legate alla Brexit sono possibili ritardi nelle consegne.


PREZZO
245,98 €
NICEPRICE
233,68 €
SCONTO
5%



Questo prodotto usufruisce delle SPEDIZIONI GRATIS
selezionando l'opzione Corriere Veloce in fase di ordine.


Pagabile anche con 18App Bonus Cultura e Carta del Docente


Facebook Twitter Aggiungi commento


Spese Gratis

Dettagli

Genere:Libro
Lingua: Inglese
Pubblicazione: 06/2021





Note Editore

Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics - with review of the physics, and more.

  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics series
  • Updated release includes the latest information on the Coulomb Interactions in Charged Particle Beams




Sommario

Preface Martin Hÿtch and Peter W. Hawkes 1. Phase retrieval methods applied to coherent imaging Tatiana Latychevskaia 2. X-ray phase-contrast imaging: a broad overview of some fundamentals David M. Paganin and Daniele Pelliccia 3. Graphyne and borophene as nanoscopic materials for electronics - with review of the physics C. M. Krowne 4. The ESAB effect and the physical meaning of the vector potential R. Carles, O. Pujol, and J.-Ph. Perez 5. Electron image plane off-axis holography of atomic structures Hannes Lichte





Autore

Dr Martin Hÿtch, serial editor for the book series "Advances in Imaging and Electron Physics (AIEP) , is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on "Quantitative high-resolution transmission electron microscopy (HRTEM) , joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.










Altre Informazioni

ISBN:

9780323915052

Condizione: Nuovo
Collana: Advances in Imaging and Electron Physics
Dimensioni: 229 x 152 mm
Formato: Copertina rigida
Pagine Arabe: 276


Dicono di noi